Dresden Fraunhofer Cluster NanoanalysisThe Fraunhofer Institute for Material and Beam Technology conducts application-oriented research and development in the areas of laser and surface technology including aspects of production technology.
Fraunhofer IWS
High Resolution SPM and Electron Microscopy: Transmission Electron Microscopy (TEM): scanning electron microscopy (SEM), scanning probe microscopy (STM, AFM)
EUV-/ X-Ray Metrology and Components: X-ray optical components, EUV-/x-ray techniques (XRR, XRD)
Highly-Resolved Mechanical a. o. Properties: Laser-acoustical characterization of thin films, nanoparticle measuring technique