For analysis in the Scanning Electron Microscope a semiconductor die is prepared in a plasma plant.
© Fraunhofer IKTS | Jürgen Lösel
For analysis in the Scanning Electron Microscope a semiconductor die is prepared in a plasma plant.

Nanoanalysis Competence in Dresden

We link seven Fraunhofer Institutes.

Dr. Jürgen Gluch (Fraunhofer IKTS) examines material samples under the transmission electron microscope (TEM).
© Dresden Fraunhofer Cluster Nanoanalysis DFCNA
Dr. Jürgen Gluch (Fraunhofer IKTS) examines material samples under the transmission electron microscope (TEM).

We make atoms visible.

Bundled Nanoanalysis Competence in Dresden

Seven Fraunhofer Institutes and three faculties of the Technische Universität Dresden as well as Helmholtz-Zentrum Berlin cluster their competencies and cover the complete range of topics in the field of nanoanalysis. The institutes are flexibly linked and also cope with comprehensive project requirements.

Our vision

Establish an internationally visible competence center for nanoanalysis as recognized partner for industry.

Our mission
 

Applied research and development in the field of nanoanalysis for discovering suitable technical and conceptual solutions.

Our tasks

  • Development of analytical methods as well as components and application strategies for analytical methods and systems
  • Analytics services for high-tech companies

Our application areas
 

  • Micro-, nano-, and optoelectronics
  • Renewable energy sources
  • Lightweight construction and functional materials