Scanning Electron Microscopy (SEM) Analytical Transmission Electron Microscopy (TEM) Focused Ion Beam Technique (FIB) REM with Energy Dispersive X-ray Micro Analysis (EDX) for Elemental Analysis
Atomic Force Acoustic Microscopy (AFAM)) Surface Potential Microscopy Electrochemical Scanning Tunneling Microscopy (STM)
X-ray Photoelectron Spectroscopy (XPS) Secondary Ion Mass Spectroscopy (SIMS) Atom Probe Tomography Fourier Transform Infrared Spectroscopy (FTIR) and Raman
Nano X-ray Microscopy / Nano X-ray Computed Tomography X-ray / EUV Reflectometry & Module Development X-Ray Diffraction Mapping Temperature-dependent X-Ray Diffraction (XRD)
Nano X-ray Microscopy / Nano X-ray Computed Tomography Photoemission Electron Microscopy (PEEM) Spectroscopy (XPS, XAS)
Thin film analysis / Ellipsometry White Light Interferometry Confocal Laser Scanning Microscopy Metallography